Overview
In today’s competitive Electronics and High Tech market, ECAD and MCAD teams must work together seamlessly in order to get winning products to market faster. Traditional collaboration methods are no longer suitable. When design changes impact both ECAD and MCAD designs, more efficient tools are required to improve communication of design changes and proposals within each discipline’s established comfort zone. The PTC Creo ECADMCAD Collaboration Extension (ECX) gives you the industry’s most PTC Creo ECX gives you a fully integrated package that offers interaction with the ECAD view, fostering ECADMCAD design collaboration. By leveraging the capabilities in PTC® Creo® View ECAD™, PTC Creo View ECAD Compare and PTC Creo View ECAD Validate, you can collaborate more efficiently by electronically proposing, identifying, managing and retracing the history of changes across mechanical and electrical disciplines. |
Key benefits
- Streamlines electromechanical design collaboration processes, reducing time-to-market and decreasing cost
- Gives mechanical engineers better insight into the potential impact of changes on electrical designs – before the changes are proposed
- Incremental data exchange enables mechanical and electrical engineers to communicate more frequently and efficiently
- Provides a consistent way to communicate changes across disciplines
- Enables you to quickly and easily identify, resolve and manage unanticipated consequences of a design change
- Improves design quality; seamless integration reduces errors and improves data integrity
- Enhances traceability of the design IP, for knowledge capture and design reuse
PTC Creo ECX derives its cutting-edge capabilities from the EDMD (also referred to as IDX) standard driven and maintained by the ProSTEP iViP Association’s ECAD/MCAD Collaboration Project Group. The EDMD standard includes a data model and protocol developed with some of the leading ECAD software providers and global manufacturers confronting the challenges of cross-discipline collaboration. This innovative approach
has been validated by leading companies in the industry and is designed to interact with other design tools used in your product development process.
Features and specifications
Easy-to-use, integrated ECAD-MCAD collaboration capabilities
- Cross-highlight between ECAD and MCAD designs
- Propose, accept or reject changes
- Quickly identify and verify incremental changes
- Easily add comments on change proposals and responses for electronic cross-team collaboration
- Capture the history of changes for future reference
- Leverage the capabilities in PTC Creo View ECAD, PTC Creo View ECAD Compare and PTC Creo View ECAD Validate
PTC Creo View ECAD capabilities
- Next-generation, truly heterogeneous visual collaboration environment for both ECAD & MCAD
- Enables unique functions, such as crosshighlighting between ECAD/MCAD abstractions including to/from PTC® Creo® Parametric™ and PTC® Creo® View™
- Ability to accept/reject Preview messages from PTC Creo Parametric to show impact of component location proposals
- Browse intelligent neutral view of ECAD design data and verify design intent
- Facilitates electronic design collaboration from author to author and with extended design team members
- Query, measure, highlight, and isolate detailed net and component data
- Communicate changes, ideas, or redline markups back to other users, using the bookmarked views of your markups
- Integrate with PTC® Windchill®, for managing ECAD data in a neutral format
PTC Creo View ECAD Compare capabilities
- Analyzes and reports object and image differences:
- Component (package, device, location, pins, properties)
- Net (pins, length, width, vias, test points, properties)
- Pin (padstack, location, properties)
- Via (padstack, location, test point, properties)
- Image (per layer and sublayer)
- Creates XML difference reports that can be shared with multiple users
- Integrates with PTC Windchill for managing results, profiles and design data
PTC Creo View ECAD Validate capabilities
- View, analyze, change and compare results through a simple interface
- Access the history of changes and differences, including their disposition
- Electrically capture who changed what, when and why, and retain for future reference
Language support
English, Japanese, Chinese (Traditional), Chinese (Simplified)